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Error rate measuring device and error rate measuring method

机译:误码率测量装置和误码率测量方法

摘要

PROBLEM TO BE SOLVED: To provide an error rate measuring device and an error rate measuring method capable of providing information for identifying a cause of a problem when a multilevel modulation signal output from a test object has a problem. SOLUTION: A PAM decoder 21 for separating a PAM4 signal from a DUT 200 into MSB and LSB bit string signals, a level measuring unit 22 for measuring the levels of the MSB and LSB bit string signals separated by the PAM decoder 21, respectively, and a level. Between the bit rate signals of MSB and LSB based on the measurement result by the level measurement section 22, and the error rate calculation section 23 that calculates the BER of the MSB and LSB bit sequence signals respectively based on the measurement result by the measurement section 22. A bit shift amount calculation unit 24 that calculates the bit shift amount, a BER calculated by the error rate calculation unit 23, and a display unit 30 that displays the bit shift amount calculated by the bit shift amount calculation unit 24 are provided. .. [Selection diagram] Figure 1
机译:解决的问题:提供一种错误率测量装置和错误率测量方法,该错误率测量设备和错误率测量方法能够提供用于在从测试对象输出的多级调制信号存在问题时识别出问题原因的信息。解决方案:PAM解码器21,用于将来自DUT 200的PAM4信号分离为MSB和LSB比特串信号;电平测量单元22,用于分别测量由PAM解码器21分离的MSB和LSB比特串信号的电平;以及一个等级。在基于电平测量部分22的测量结果的MSB和LSB的比特率信号与误差率计算部分23之间,误差率计算部分23根据测量部分的测量结果分别计算MSB和LSB比特序列信号的BER 22.提供了计算位偏移量的位偏移量计算单元24,由错误率计算单元23计算的BER以及显示由位偏移量计算单元24计算的位偏移量的显示单元30。 .. [选择图]图1

著录项

  • 公开/公告号JP2020120148A

    专利类型

  • 公开/公告日2020-08-06

    原文格式PDF

  • 申请/专利权人 アンリツ株式会社;

    申请/专利号JP20190006919

  • 发明设计人 保坂 恭男;山根 一浩;

    申请日2019-01-18

  • 分类号H04L1;H04L25/49;

  • 国家 JP

  • 入库时间 2022-08-21 11:36:02

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