Test fixture with sintered connection between motherboard and daughterboard

摘要

The test fixture (120) includes a motherboard (225) having a test signal line (223) configured to couple (651) to the test station (650). The motherboard (225) includes a recessed area with a contact pad (428) coupled to the test signal line (223). The daughter board (230) is engaged with the recessed area so that the top surface of the daughter board (230) is approximately coplanar with the top surface of the motherboard (225). The daughter board (230) includes a test signal line coupled to a contact pad (638) on the daughter board (230). The contact pad (638) on the daughter board (230) is aligned with the contact pad (428) on the motherboard (225) and is permanently bonded by a sintered bond (640).