Reference position acquisition method, reference position acquisition device, pattern drawing method, pattern drawing device, and program

摘要

PROBLEM TO BE SOLVED: To easily acquire a plurality of reference position and a plurality of corresponding reference position images for detecting stain of a circuit board from an engineering pattern.SOLUTION: A first shape symmetric to an axis parallel to a first direction is acquired from each of a plurality of noticed images extracted from an engineering pattern which is a pattern on engineering (Step S22). A first total length which is sum of lengths of the first shape in the first direction is acquired (Step S23). Same treatment is conducted on a second direction vertical to the first direction and a second total length is acquired (Step S24, S25). A score showing degree of suitability of the noticed images to a reference position image is acquired from the first total length and the second total length (Step S26). A plurality of corresponding reference position images are acquired by determining a plurality of reference positions based on the score.SELECTED DRAWING: Figure 5A