首页> 外国专利> Surface temperature distribution measuring device and measuring method

Surface temperature distribution measuring device and measuring method

机译:表面温度分布测定装置及测定方法

摘要

PROBLEM TO BE SOLVED: To simultaneously measure surface temperature distributions in an outer peripheral direction of a measurement target object with a simple device.SOLUTION: There is provided an apparatus that receives infrared radiation light from a measurement target object 2 to measure the surface temperature of the measurement target object 2, and comprises one infrared thermal image device 11 and at least two or more infrared mirrors 12. The infrared thermal image device 11 directly receives infrared radiation light from a predetermined direct measurement rage on the surface of the measurement target object 2; the infrared mirrors 12 receive infrared radiation light from a range other than the direct measurement range on the surface of the measurement target object 2 and reflect the light toward the infrared thermal image device 11; and the infrared thermal image device 11 further receives the reflected light from the infrared mirrors 12.SELECTED DRAWING: Figure 1
机译:解决的问题:用简单的装置同时测量被测量物的外周方向上的表面温度。解决方案:提供一种装置,该装置接收来自被测量物2的红外光以测量被测物的表面温度。红外热像仪11包括一个红外热像仪11和至少两个或多个红外镜12。红外热像仪11直接从被测物2的表面接收来自预定直接测量范围的红外辐射光。 ;红外线反射镜12从被测定物2的表面上的直接测定范围以外的范围接收红外线辐射,并向红外线热像装置11反射。红外热像仪11进一步接收来自红外镜12的反射光。

著录项

  • 公开/公告号JP6679915B2

    专利类型

  • 公开/公告日2020-04-15

    原文格式PDF

  • 申请/专利权人 日本製鉄株式会社;

    申请/专利号JP20150243049

  • 发明设计人 大門 靖彦;坂本 明洋;

    申请日2015-12-14

  • 分类号G01J5/48;G01J5;

  • 国家 JP

  • 入库时间 2022-08-21 11:34:09

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号