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Structure surface inspection apparatus, structure surface inspection system including the same, and structure surface inspection method

机译:结构表面检查设备,包括该结构表面检查系统的结构表面检查系统以及结构表面检查方法

摘要

PROBLEM TO BE SOLVED: To provide a structure surface inspection device capable of achieving cost reduction, a structure surface inspection system having the same, and a structure surface inspection method.SOLUTION: A structure surface inspection device 5 that is mounted on mobile means 3 and inspects a surface of a structure as mobile means moves includes a radiation unit 6 for radiating linear light that extends in a direction B that intersects with a mobile direction M toward the surface of the structure, and a line camera 8 for imaging the surface of the structure of a portion where light is radiated by the radiation unit 6 along the direction B intersecting with the mobile direction. A radiation direction of light by the radiation unit 6 and an imaging direction by the line camera 8 are arranged on the same flat surface.SELECTED DRAWING: Figure 1
机译:解决的问题:为了提供一种能够降低成本的结构表面检查装置,具有该结构表面检查系统的结构表面检查方法和解决方案。解决方案:结构表面检查装置5安装在移动装置3和当移动装置移动时检查结构的表面,包括:辐射单元6,用于向与该结构的表面相交的方向B,该方向B与移动方向M相交;线性摄像机8,用于对结构的表面成像。辐射单元6沿着与移动方向相交的方向B辐射光的部分的结构。辐射单元6的光辐射方向和线相机8的成像方向布置在同一平面上。

著录项

  • 公开/公告号JP6628669B2

    专利类型

  • 公开/公告日2020-01-15

    原文格式PDF

  • 申请/专利权人 倉敷紡績株式会社;

    申请/专利号JP20160071611

  • 发明设计人 藤原 稔文;二村 孝房;

    申请日2016-03-31

  • 分类号G01N21/88;

  • 国家 JP

  • 入库时间 2022-08-21 11:33:56

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