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Facility inspection support program, facility inspection support method, and information processing device

机译:设施检查支援程序,设施检查支援方法以及信息处理装置

摘要

PROBLEM TO BE SOLVED: To provide a facility inspection support program, facility inspection support method, and information processing apparatus that can display information necessary for facility inspection.SOLUTION: A facility inspection support program causes, according to reception of identification information on a reference object, a computer to execute processing of providing an AR content corresponding to the received identification information. When abnormality is detected on the facility, the facility inspection support program causes the computer to execute processing of switching an AR content to be provided between a case where abnormality is detected on the facility and a case where abnormality is not detected on the facility.SELECTED DRAWING: Figure 1
机译:解决的问题:提供可以显示设施检查所需的信息的设施检查支持程序,设施检查支持方法和信息处理设备。解决方案:设施检查支持程序根据对基准对象的识别信息的接收来进行。 ,计算机执行提供与接收到的识别信息相对应的AR内容的处理。当在设施上检测到异常时,设施检查支持程序使计算机执行在设施上检测到异常的情况和设施上未检测到异常的情况之间切换要提供的AR内容的处理。图:图1

著录项

  • 公开/公告号JP6736898B2

    专利类型

  • 公开/公告日2020-08-05

    原文格式PDF

  • 申请/专利权人 富士通株式会社;

    申请/专利号JP20160018291

  • 发明设计人 安藤 哲也;

    申请日2016-02-02

  • 分类号G05B23/02;

  • 国家 JP

  • 入库时间 2022-08-21 11:32:35

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