Wavelength calibration method and spectrophotometer using the wavelength calibration method

摘要

PROBLEM TO BE SOLVED: To provide a wavelength calibration method with which it is possible to shorten a wavelength calibration time while sufficiently calibrating an assembly error or cyclic error of a spectrometer.SOLUTION: Provided is a wavelength calibration method for calibrating using a correction formula, comprising: a first measurement step for measuring a wavelength with respect to N bright line spectra in a range of reference wavelengths Λ± Δλand thereby obtaining N measured wavelengths λ; a first coefficient determination step for roughly determining a coefficient pertaining to an assembly error; a second measurement step for measuring a wavelength with respect to (X-N) bright line spectra in a wavelength range 2Δλthat is narrower than 2Δλon the basis of the coefficient pertaining to the assembly error and thereby obtaining (X-N) measured wavelengths λ; and a second coefficient determination step for re-determining the coefficient pertaining to the assembly error with high accuracy.SELECTED DRAWING: Figure 2