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Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
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机译:用于为在晶片上执行测量的过程创建或执行动态采样方案的方法和系统
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摘要
Various methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers are provided. One method for creating a dynamic sampling scheme for a process during which measurements are performed on wafers includes performing the measurements on all of the wafers in at least one lot at all measurement spots on the wafers. The method also includes determining an optimal sampling scheme, an enhanced sampling scheme, a reduced sampling scheme, and thresholds for the dynamic sampling scheme for the process based on results of the measurements. The thresholds correspond to values of the measurements at which the optimal sampling scheme, the enhanced sampling scheme, and the reduced sampling scheme are to be used for the process.
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