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Information handling system and method to dynamically detect and recover from thermally induced memory failures

机译:信息处理系统和方法,以动态检测热诱导的内存故障并从中恢复

摘要

Embodiments of information handling systems (IHSs) and methods are provided herein to dynamically detect and recover from thermally induced memory failures. Some embodiments include receiving an interrupt corresponding to a memory failure, detecting a current temperature of one or more memory components, and performing a series of memory tests on a specific block of memory within the memory components if the current temperature exceeds a maximum operating temperature specified for the memory components. Some embodiments include storing original contents of the specific block of memory within another memory component of the IHS, performing a first memory test on the specific block of memory at the current temperature, subsequently performing a second memory test on the specific block of memory at a temperature significantly lower than the current temperature, and determining that the memory failure is a thermally induced memory failure if the first memory test fails and the second memory test passes.
机译:本文提供了信息处理系统(IHS)和方法的实施例,以动态地检测并从热引起的存储器故障中恢复。一些实施例包括:接收与存储器故障相对应的中断;检测一个或多个存储器组件的当前温度;以及如果当前温度超过指定的最大工作温度,则对该存储器组件内的特定存储器块执行一系列存储器测试。用于内存组件。一些实施例包括将特定存储器块的原始内容存储在IHS的另一存储器组件内,在当前温度下对特定存储器块执行第一存储器测试,随后在存储器中对特定存储器块执行第二存储器测试。温度显着低于当前温度,并确定如果第一个内存测试失败并且第二个内存测试通过,则该内存故障是热诱发的内存故障。

著录项

  • 公开/公告号US10777296B2

    专利类型

  • 公开/公告日2020-09-15

    原文格式PDF

  • 申请/专利权人 DELL PRODUCTS L.P.;

    申请/专利号US201916270974

  • 发明设计人 CRAIG L. CHAIKEN;MICHAEL W. ARMS;

    申请日2019-02-08

  • 分类号G11C29/50;

  • 国家 US

  • 入库时间 2022-08-21 11:30:57

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