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Electron microscope for magnetic field measurement and magnetic field measurement method
Electron microscope for magnetic field measurement and magnetic field measurement method
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机译:电子显微镜的磁场测量及磁场测量方法
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摘要
An electron microscope that measures electromagnetic field information separates an electric field distribution and a magnetic field distribution of a specimen with high precision to measure the electromagnetic field information. The electron microscope is configured with an electron source 1, an electron gun deflection coil 3, converging lenses 4a and 4b, an irradiation system astigmatic compensation coil 5, irradiation system deflection coils 6a and 6b, a magnetic field application coil 8, an objective lens 11, an imaging system astigmatic compensation coil 12, imaging system deflection coils 13a and 13b, a magnifying lens 17, an electron detector 18, a control analysis apparatus 20, and the like, and the control analysis apparatus 20 repeats a plurality of times measurement of first electromagnetic field information with an output signal from the electron detector by exercising first electron beam control after a first magnetic field is applied to the specimen 10 and then measurement of second electromagnetic field information similarly by exercising second electron beam control after a second magnetic field is applied to the specimen, and separates and measures an electric field distribution and a magnetic field distribution with high precision from the obtained first and second electromagnetic field information.
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机译:测量电磁场信息的电子显微镜以高精度分离样本的电场分布和磁场分布,以测量电磁场信息。电子显微镜配置有电子源 1 B>,电子枪偏转线圈 3 B>,会聚透镜 4 B> a I>和 4 B> b I>,辐照系统像散补偿线圈 5 B>,辐照系统偏转线圈 6 B> a < / I>和 6 B> b I>,磁场施加线圈 8 B>,物镜 11 B>,成像系统像散补偿线圈 12 B>,成像系统偏转线圈 13 B> a I>和 13 B> b I>,放大透镜 17 B>,电子检测器 18 B>,控制分析装置 20 B>等以及控制分析装置 20 B>在将第一磁场施加到样本 10 B>之后,通过执行第一电子束控制,利用电子检测器的输出信号重复多次测量第一电磁场信息同样地通过锻炼第二电磁场信息在向样品施加第二磁场之后进行第二电子束控制,并从获得的第一和第二电磁场信息中分离并测量高精度的电场分布和磁场分布。
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