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Time base correction method for high accuracy sampling scope-based measurements
Time base correction method for high accuracy sampling scope-based measurements
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机译:高精度采样范围测量的时基校正方法
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摘要
A method and apparatus for resolving time base-generated errors from sampling scope-based measurements. Mutually synchronized repetitive waveform-to-be-analyzed signals (WAS) and repetitive sinusoidal reference signals (RS) are respectively applied to a first channel and a second channel of a sampling scope. A time base generator applies a sampling signal to the first and second channels. An average sine wave period Tav for k samples of RS is determined, followed by determination of phase error φk for each of the k samples, corresponding to phase differences between an ideal sine wave signal and the applied reference sinusoidal signal. Time base error values dk for k samples are calculated from dk=φk*Tav/2π. Error values dk correct time base errors in the sampling signal, and the WAS is re-sampled at sampling times adjusted by dk.
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机译:一种用于从基于采样范围的测量中解决时基产生的误差的方法和装置。相互同步的要分析的重复波形信号(WAS)和重复正弦参考信号(RS)分别应用于采样示波器的第一通道和第二通道。时基发生器将采样信号施加到第一和第二通道。确定RS的k个样本的平均正弦波周期T av Sub>,然后确定k个样本中每个样本的相位误差Φ k Sub>理想的正弦波信号和施加的参考正弦信号。 k个样本的时基误差值d k Sub>是根据d k Sub> =φ k Sub> * T av Sub> / 2 B>π。误差值d k Sub>纠正了采样信号中的时基误差,并且WAS在由d k Sub>调整的采样时间进行了重新采样。
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