首页>
外国专利>
Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers
Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers
展开▼
机译:对样品结构进行高分辨率成像的方法,该结构用荧光标记标记
展开▼
页面导航
摘要
著录项
相似文献
摘要
In methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers, the sample is subjected to a light intensity distribution including an intensity maximum of focused fluorescence excitation light to selectively scan partial areas of interest of the sample. Fluorescence light emitted out of the sample is registered and allocated to a respective location of the light intensity distribution in the sample. The subjection of the sample to at least one part of the light intensity distribution is terminated at each location of the light intensity distribution, if at least one criterion of the following criteria is met: (a) a predetermined maximum light amount of the fluorescence light emitted out of the sample has been registered, and (b) a predetermined minimum light amount of the fluorescence light emitted out of the sample has not been registered within a predetermined period of time.
展开▼