首页> 外国专利> Systems, methods and apparatuses are provided for enhanced surface condition detection based on image scene and ambient light analysis

Systems, methods and apparatuses are provided for enhanced surface condition detection based on image scene and ambient light analysis

机译:提供了用于基于图像场景和环境光分析的增强的表面状况检测的系统,方法和设备

摘要

Systems, Methods and Apparatuses are provided for detecting surface conditions, which includes: an image scene captured by a camera wherein the image scene includes: a set of a plurality of regions of interest (ROIs); and a processor configured to receive the image scene to: extract at least a first and a second ROI from the set of the plurality of ROIs of the image scene; associate the first ROI with an above-horizon region and associate the second ROI with a surface region; analyze the first ROI and the second ROI in parallel for a condition related to an ambient lighting in the first ROI and for an effect related to the ambient lighting in the second ROI; and extract from the first ROI features of the condition of the ambient lighting and extract from the second ROI features of the effect of the ambient lighting on a surface region.
机译:提供了用于检测表面状况的系统,方法和设备,其包括:由照相机捕获的图像场景,其中,图像场景包括:多个感兴趣区域(ROI)的集合;处理器,用于接收图像场景,以:从图像场景的多个ROI的集合中提取至少第一ROI和第二ROI;将第一ROI与地平线以上区域相关联,并且将第二ROI与表面区域相关联;并行地分析第一ROI和第二ROI,以用于与第一ROI中的环境照明有关的条件以及与第二ROI中的环境照明有关的效果;从环境照明条件的第一ROI特征中提取并从环境区域对表面区域的影响的第二ROI特征中提取。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号