首页> 外国专利> CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLEAVED DIGITIZER USING HARMONIC MIXING

CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLEAVED DIGITIZER USING HARMONIC MIXING

机译:使用谐波混频对包括时间间隔异步数字化仪在内的测试和测量仪器进行校准

摘要

A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
机译:测试和测量仪器包括耦合到可编程滤波器的系数存储设备。系数存储设备被配置为存储至少两个预定滤波器系数组,并且被配置为基于使用补偿振荡器得出的测量结果将至少两个预定滤波器系数组中的选定一个传递给滤波器。该测量可以包括时钟延迟和时钟偏斜。在一些示例中,除了选择适当的滤波器系数之外,测试和测量仪器还可调节时钟延迟和/或时钟偏斜。

著录项

  • 公开/公告号US2019377008A1

    专利类型

  • 公开/公告日2019-12-12

    原文格式PDF

  • 申请/专利权人 TEKTRONIX INC.;

    申请/专利号US201916450921

  • 发明设计人 DANIEL G. KNIERIM;BARTON T. HICKMAN;

    申请日2019-06-24

  • 分类号G01R13/02;H03M1/10;H03M1/06;H03M1/12;

  • 国家 US

  • 入库时间 2022-08-21 11:25:36

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