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Determining transient error functional masking and propagation probabilities

机译:确定瞬态误差功能掩盖和传播概率

摘要

A method, system and product for determining transient error functional masking and propagation probabilities. An Error Infliction Probability of pair of nodes (source and destination) is representative of a Transient Error happening on a source node propagating to the destination node. The probability is computed by simulating a propagation of a transient error for plurality of cycles in a given trace. The simulation utilizes values from the trace for nodes that are not influenced by the error (but may influence its propagation). A plurality of cycle-simulations may be performed and a ratio of a number of times the transient error propagated to the destination node compared to a number of cycles examined may be used to compute the error infliction probability.
机译:用于确定瞬时误差功能掩蔽和传播概率的方法,系统和产品。一对节点(源和目标)的错误引发概率表示在传播到目标节点的源节点上发生的瞬时错误。通过模拟给定轨迹中多个周期的瞬态误差的传播来计算概率。该仿真将跟踪的值用于不受错误影响(但可能影响其传播)的节点。可以执行多个周期模拟,并且可以将传播到目的地节点的瞬态错误的次数与所检查的周期的数目之比用于计算错误造成的概率。

著录项

  • 公开/公告号US10502779B2

    专利类型

  • 公开/公告日2019-12-10

    原文格式PDF

  • 申请/专利权人 OPTIMA DESIGN AUTOMATION LTD.;

    申请/专利号US201615045448

  • 发明设计人 JAMIL RAJA MAZZAWI;AYMAN KAMIL MOUALLEM;

    申请日2016-02-17

  • 分类号G06F17/50;G01R31/317;G01R31/3177;

  • 国家 US

  • 入库时间 2022-08-21 11:24:06

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