首页> 外国专利> PREDICTIVE ON-CHIP VOLTAGE SIMULATION TO DETECT NEAR-FUTURE UNDER VOLTAGE CONDITIONS

PREDICTIVE ON-CHIP VOLTAGE SIMULATION TO DETECT NEAR-FUTURE UNDER VOLTAGE CONDITIONS

机译:预测芯片上电压仿真,以检测电压条件下的近况

摘要

Embodiments of the present disclosure relate to detecting undervoltage conditions at a subcircuit. A power supply current of a first subcircuit is determined over a first number of previous clock cycles. A cross current flowing between the first subcircuit and a second subcircuit is determined over the first number of previous clock cycles. An estimated momentary supply voltage present at the first subcircuit is then determined based on the power supply current of the first subcircuit over the first number of previous clock cycles and the cross current flowing between the first subcircuit and the second subcircuit over the first number of previous clock cycles.
机译:本公开的实施例涉及检测子电路处的欠压状况。在先前时钟周期的第一数量上确定第一子电路的电源电流。在先前时钟周期的第一数量上确定在第一子电路和第二子电路之间流动的交叉电流。然后基于在前一个时钟周期的第一数量上的第一子电路的电源电流以及在前一个时钟周期的第一数量上的第一子电路和第二子电路之间流动的交叉电流,确定在第一子电路上存在的估计瞬时电源电压。时钟周期。

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