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METHOD FOR IMAGING A SAMPLE USING A FLUORESCENCE MICROSCOPE WITH STIMULATED EMISSION DEPLETION

机译:带有激发发射损耗的荧光显微镜对样品成像的方法

摘要

A method for imaging a sample using a fluorescence microscope with stimulated emission depletion includes controlling the fluorescence microscope and an imaging process of the fluorescence microscope by a microscope controller. An overview image of a target region is generated with a second spatial resolution prior to the imaging process, the second spatial resolution being lower than a first spatial resolution used for scanning sample segments in the imaging process and higher than a third spatial resolution that has been adapted to an extent of an excitation light distribution. The overview image is analyzed to identify image regions without relevant image information. A radiant flux of the depletion light distribution is reduced within a scope of the imaging process when scanning sample segments which are assigned to the image regions without relevant image information.
机译:一种使用具有激发发射损耗的荧光显微镜对样品成像的方法,包括通过显微镜控制器控制荧光显微镜和荧光显微镜的成像过程。在成像过程之前以第二空间分辨率生成目标区域的概览图像,该第二空间分辨率低于在成像过程中用于扫描样本段的第一空间分辨率,并且高于已经成像的第三空间分辨率。适合于激发光分布的程度。分析概述图像以识别没有相关图像信息的图像区域。当在没有相关图像信息的情况下扫描分配给图像区域的样本片段时,在成像过程的范围内减少了耗尽光分布的辐射通量。

著录项

  • 公开/公告号US2020341253A1

    专利类型

  • 公开/公告日2020-10-29

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS CMS GMBH;

    申请/专利号US201816955803

  • 发明设计人 JONAS FOELLING;

    申请日2018-12-20

  • 分类号G02B21;G01N21/64;

  • 国家 US

  • 入库时间 2022-08-21 11:23:09

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