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SILICON-BASED VISIBLE AND NEAR-INFRARED OPTOELECTRIC DEVICES

机译:基于硅的可见光和近红外光电设备

摘要

In one aspect, the present invention provides a silicon photodetector having a surface layer that is doped with sulfur inclusions with an average concentration in a range of about 0.5 atom percent to about 1.5 atom percent. The surface layer forms a diode junction with an underlying portion of the substrate. A plurality of electrical contacts allow application of a reverse bias voltage to the junction in order to facilitate generation of an electrical signal, e.g., a photocurrent, in response to irradiation of the surface layer. The photodetector exhibits a responsivity greater than about 1 A/W for incident wavelengths in a range of about 250 nm to about 1050 nm, and a responsivity greater than about 0.1 A/W for longer wavelengths, e.g., up to about 3.5 microns.
机译:一方面,本发明提供一种硅光电探测器,该硅光电探测器具有掺杂有硫夹杂物的表面层,所述硫夹杂物的平​​均浓度在大约0.5原子百分比至大约1.5原子百分比的范围内。表面层与衬底的下面部分形成二极管结。多个电触点允许向结施加反向偏置电压,以便于响应于表面层的辐照而产生电信号,例如光电流。对于在约250nm至约1050nm范围内的入射波长,光电检测器表现出大于约1A / W的响应度,而对于更长的波长(例如,高达约3.5微米),则表现出大于约0.1A / W的响应率。

著录项

  • 公开/公告号US2020028002A1

    专利类型

  • 公开/公告日2020-01-23

    原文格式PDF

  • 申请/专利权人 PRESIDENT AND FELLOWS OF HARVARD COLLEGE;

    申请/专利号US201916532146

  • 发明设计人 ERIC MAZUR;JAMES EDWARD CAREY;

    申请日2019-08-05

  • 分类号H01L31/0236;H01L31/068;H01L31/028;H01L31/18;H01L31/036;H01L31/0288;H01L21/268;

  • 国家 US

  • 入库时间 2022-08-21 11:21:32

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