首页> 外国专利> method and apparatus for determining a representative measurement which is indicative of a relative oscillation speed of a reference clock over a representative calibration period; and apparatus for determining a measured number of cycles of a reference clock signal that occurs during a representative calibration period

method and apparatus for determining a representative measurement which is indicative of a relative oscillation speed of a reference clock over a representative calibration period; and apparatus for determining a measured number of cycles of a reference clock signal that occurs during a representative calibration period

机译:用于确定代表性测量的方法和设备,该代表性测量指示在代表性校准周期内参考时钟的相对振荡速度;和设备,用于确定在代表性校准周期内出现的参考时钟信号的测量周期数

摘要

method and apparatus for determining a representative measurement which is indicative'be a relative oscillation speed of a reference clock over a representative calibration period; and apparatus for determining a measured number of cycles of a reference clock signal that occurs during a representative calibration period shall be determined.a representative measurement indicating a relative oscillation speed of a reference clock over a representative calibration period. Multiple.calibration periods are defined,including first and second calibration periods. the first calibration period starts at the first moment of departure, where a first time deviation value is equal to a difference between the first moment of departure and a point of transition of the reference clock signal within the first calibration period. The second calibration period shall begin at a second starting point,where a second time deviation value is equal to a difference between the second departure moment and a transition point of the reference clock signal within the second calibration period. the first and second time deviation values are different from each other. Measurements are generated for each of the calibration periods by measuring the speed of the reference clock. the measurements are then submitted to mean.
机译:用于确定代表性测量的方法和设备,该代表性测量指示在代表性校准周期内参考时钟的相对振荡速度;应当确定用于确定在代表性校准周期期间发生的参考时钟信号的测量的周期数的设备。代表性测量值指示在代表性校准周期内参考时钟的相对振荡速度。定义了多个校准周期,包括第一和第二校准周期。第一校准周期在第一偏离时刻开始,其中第一时间偏差值等于第一偏离时刻与在第一校准周期内参考时钟信号的转变点之间的差。第二校准周期应从第二起始点开始,其中第二时间偏差值等于第二校准周期内第二离开时刻与参考时钟信号过渡点之间的差。第一和第二时间偏差值彼此不同。通过测量参考时钟的速度为每个校准周期生成测量。然后将测量结果提交给平均值。

著录项

  • 公开/公告号BRPI0717795B1

    专利类型

  • 公开/公告日2020-01-07

    原文格式PDF

  • 申请/专利权人 TELEFONAKTIEBOLAGET LM ERICSSON (PUBL);

    申请/专利号BR2007PI17795

  • 发明设计人 JACOBUS HAARTSEN;

    申请日2007-09-11

  • 分类号G01R23/10;B65D39/12;H03L1;H03L7;

  • 国家 BR

  • 入库时间 2022-08-21 11:18:10

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