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Process and apparatus for positioning microscopic samples using a two-dimensional positioning table
Process and apparatus for positioning microscopic samples using a two-dimensional positioning table
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机译:使用二维定位台定位显微样品的方法和设备
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摘要
The method of the present invention relates to a method of positioning a sample in a microscope system, wherein the point of interest of the sample (ROI) on the sample is observed and / or processed by the microscope system and wherein the microscope system exhibits: an optical axis; movable workbench for sample collection; a storage device for storing data records describing the positions of the sample; a control device which, by means of stored data records, can control the movement of the workbench.The procedure comprises the steps of: a) holding a sample point (ROI) in the first position; b) storing a first data record describing the first position; c) storing a second data record describing the second position, the second position being connected to an independent position d) invoking the stored data records so that the work table is moved such that the sample point is held in the position described triggered by a data sentence.
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