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COLLECTION OF TOMOGRAPHIC INSPECTION DATA USING COMPTON SCATTERING
COLLECTION OF TOMOGRAPHIC INSPECTION DATA USING COMPTON SCATTERING
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机译:使用康普顿散射收集断层检查数据
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摘要
There is described a method and apparatus for collecting Tomographic inspection data of objects using Compton scatter radiation. The apparatus is of size and weight for portable use within industrial facilities and may be used for assessing integrity of infrastructures in terms of material density, missing materials, thickness of materials, and identification of foreign materials.
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