INFRARED-LASER BEAM-PROFILE MEASUREMENT METHOD AND MEASUREMENT SYSTEM

摘要

To make it possible to measure the beam profile of an infrared laser using an inexpensive image sensor, this measurement system is made to comprise: (A) an image sensor that is for visible light measurement and on which an infrared laser is emitted; and (B) an information processing device for determining whether a peak pixel value identified from pixel values measured by the image sensor during a given exposure time is within a prescribed numerical range and, upon determining that the peak pixel value is within the prescribed numerical range, calculating the beam profile of the infrared laser on the basis of the pixel values measured by the image sensor.