首页> 外国专利> METHOD OF CHARACTERIZING AN OPTICAL SENSOR CHIP, METHOD OF CALIBRATING AN OPTICAL SENSOR CHIP, METHOD OF OPERATING AN OPTICAL SENSOR DEVICE, OPTICAL SENSOR DEVICE AND CALIBRATION SYSTEM

METHOD OF CHARACTERIZING AN OPTICAL SENSOR CHIP, METHOD OF CALIBRATING AN OPTICAL SENSOR CHIP, METHOD OF OPERATING AN OPTICAL SENSOR DEVICE, OPTICAL SENSOR DEVICE AND CALIBRATION SYSTEM

机译:表征光学传感器芯片的方法,校准光学传感器芯片的方法,操作光学传感器设备的方法,光学传感器设备和校准系统

摘要

Means are suggested for calibration in the field of optical sensors, e.g. characterizing and calibrating an optical sensor chip. In order to address complexity of sensor data with high accuracy the optical sensor, e.g. an optical sensor is not provided as an already calibrated unit. Rather, sensor response data may be recorded in a defined or standardized environment, e.g. at a production line, and with high precision. This high standard sensor response data can be obtained on a per device basis and, thus, is referenced with an unambiguous chip identification number, chip ID. The sensor data is complemented with a dedicated calibration algorithm which can be tailor-made to fit the optical sensor or the optical sensor chip. In order to retrieve the sensor response data and the calibration algorithm both can be made available by means of the chip ID, for example.
机译:建议在光学传感器领域中用于校准的手段,例如,在光学传感器中。表征和校准光学传感器芯片。为了高精度地解决传感器数据的复杂性,光学传感器例如是未提供光学传感器作为已校准的单元。而是,传感器响应数据可以被记录在定义的或标准化的环境中,例如。在生产线上,而且精度很高。可以在每个设备的基础上获得此高标准传感器响应数据,因此可以使用明确的芯片标识号(芯片ID)作为参考。传感器数据补充有专用的校准算法,该算法可以量身定制以适合光学传感器或光学传感器芯片。为了检索传感器响应数据和校准算法,例如,都可以通过芯片ID来使两者均可用。

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