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PARTICLE VERIFICATION METHOD, CHIP FOR CAPTURING PARTICLES, AND PARTICLE ANALYSIS SYSTEM
PARTICLE VERIFICATION METHOD, CHIP FOR CAPTURING PARTICLES, AND PARTICLE ANALYSIS SYSTEM
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机译:粒子验证方法,捕获粒子的芯片和粒子分析系统
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摘要
The present invention provides technology for verifying the collection of particles of interest in single-cell analysis. Provided is a particle verification method including: an associating step in which identification information from a particle captured in a well within a particle capture area and position information for the well are associated; a discharge step in which the particle is discharged from the well; an identification information acquisition step in which the identification information of the particle is acquired after the discharge step; and a verification step in which the position of the well in which the particle was captured is verified on the basis of the acquired identification information. Also provided are a chip for capturing particles and a particle analysis system that are used to perform the method.
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