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PARTICLE VERIFICATION METHOD, CHIP FOR CAPTURING PARTICLES, AND PARTICLE ANALYSIS SYSTEM

机译:粒子验证方法,捕获粒子的芯片和粒子分析系统

摘要

The present invention provides technology for verifying the collection of particles of interest in single-cell analysis. Provided is a particle verification method including: an associating step in which identification information from a particle captured in a well within a particle capture area and position information for the well are associated; a discharge step in which the particle is discharged from the well; an identification information acquisition step in which the identification information of the particle is acquired after the discharge step; and a verification step in which the position of the well in which the particle was captured is verified on the basis of the acquired identification information. Also provided are a chip for capturing particles and a particle analysis system that are used to perform the method.
机译:本发明提供了用于在单细胞分析中验证目标颗粒的收集的技术。提供一种粒子验证方法,包括:关联步骤,其中将来自在粒子捕获区域内的阱中捕获的粒子的识别信息与该孔的位置信息相关联;以及排出步骤,其中将颗粒从井中排出;识别信息获取步骤,其中在排出步骤之后获取颗粒的识别信息;验证步骤,其中基于获取的识别信息来验证其中捕获了粒子的孔的位置。还提供了用于捕获颗粒的芯片和用于执行该方法的颗粒分析系统。

著录项

  • 公开/公告号WO2020129462A1

    专利类型

  • 公开/公告日2020-06-25

    原文格式PDF

  • 申请/专利权人 SONY CORPORATION;

    申请/专利号WO2019JP44100

  • 申请日2019-11-11

  • 分类号G01N15/10;C12M1/34;C12Q1/6834;C12Q1/6869;G01N21/64;G01N33/53;G01N37;

  • 国家 WO

  • 入库时间 2022-08-21 11:10:31

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