首页> 外国专利> LASER DESORPTION, ABLATION, AND IONIZATION SYSTEM FOR MASS SPECTROMETRY ANALYSIS OF SAMPLES INCLUDING ORGANIC AND INORGANIC MATERIALS

LASER DESORPTION, ABLATION, AND IONIZATION SYSTEM FOR MASS SPECTROMETRY ANALYSIS OF SAMPLES INCLUDING ORGANIC AND INORGANIC MATERIALS

机译:包括有机和无机材料样品的质谱分析的激光脱附,烧蚀和电离系统

摘要

Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
机译:用于样品分析的系统和方法包括:使用第一激光源向样品施加第一束以从样品的位置解吸有机材料,并使用第二激光源将解吸的有机材料电离以产生电离的有机材料。然后使用质谱仪分析离子化的有机材料。然后将来自第一激光器的第二光束施加到样品上,以从样品的位置烧蚀无机材料。然后使用第二激光源将烧蚀的无机材料电离以产生电离的无机材料。然后使用质谱仪分析离子化的无机材料。在分析期间,也可以捕获样品的一个或多个图像并将其链接到收集的分析数据。

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