首页> 外国专利> ULTRAHIGH-RESOLUTION HIGH-SPEED PARALLEL PROCESSING AUTO-INSPECTION APPARATUS FOR HIGH-INTEGRATION PRINTED CIRCUIT BOARD

ULTRAHIGH-RESOLUTION HIGH-SPEED PARALLEL PROCESSING AUTO-INSPECTION APPARATUS FOR HIGH-INTEGRATION PRINTED CIRCUIT BOARD

机译:高集成度印刷电路板的超高分辨率高速并行处理自动检测装置

摘要

According to the present invention, provided is an ultrahigh-resolution high-speed parallel processing auto-inspection apparatus for a high-integration printed circuit board. The ultrahigh-resolution high-speed parallel processing auto-inspection apparatus includes: a line scan camera for obtaining a surface image of an inspection surface of a PCB; a lighting part emitting light to the inspection surface of the PCB; a vertical movement member supporting the line scan camera to be vertically moved; a laser displacement sensor obtaining inclination information of the inspection surface by pre-scanning the inspection surface of the PCB before obtaining the surface image of the inspection surface of the PCB, and then, measuring the distance between the line scan camera and the inspection surface of the PCB in real time to keep the distance therebetween during the procedure of obtaining the surface image; and a displacement compensation means pre-controlling the movement of the vertical movement member by referring to the inclination information pre-obtained during the procedure of obtaining the surface image, and then, controlling the movement of the vertical movement member to compensate for displacement corresponding to a difference value if there is a change in the displacement measured by the laser displacement sensor. Therefore, the apparatus is capable of enabling quick and accurate defect detection from a PCB.;COPYRIGHT KIPO 2020
机译:根据本发明,提供了一种用于高集成度印刷电路板的超高分辨率高速并行处理自动检查装置。超高分辨率高速并行处理自动检查装置包括:线扫描相机,用于获得PCB的检查表面的表面图像;发光部分向PCB的检查表面发光;垂直移动构件,其支撑线扫描相机垂直移动;激光位移传感器在获得PCB的检查表面的表面图像之前,先对PCB的检查表面进行预扫描,从而获得检查表面的倾斜度信息,然后测量线扫描相机与扫描仪的检查表面之间的距离在获取表面图像的过程中,实时地在PCB上保持它们之间的距离;位移补偿装置通过参考在获取表面图像的过程中预先获得的倾角信息来预控制垂直运动构件的运动,然后控制垂直运动构件的运动以补偿与如果激光位移传感器测量的位移发生变化,则为差值。因此,该设备能够从PCB上快速,准确地检测缺陷。; COPYRIGHT KIPO 2020

著录项

  • 公开/公告号KR20200014137A

    专利类型

  • 公开/公告日2020-02-10

    原文格式PDF

  • 申请/专利权人 SEEMAX INC.;

    申请/专利号KR20180089617

  • 发明设计人 LEE JUN UK;

    申请日2018-07-31

  • 分类号G01N21/956;G01B11/24;

  • 国家 KR

  • 入库时间 2022-08-21 11:07:54

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