首页> 外国专利> - - X- X-Ray Inspection using Wavelength-Shifting Fiber-Coupled Scintillation Detectors

- - X- X-Ray Inspection using Wavelength-Shifting Fiber-Coupled Scintillation Detectors

机译:--使用波长移位光纤耦合闪烁探测器进行X射线检查

摘要

The present invention relates to detectors and methods for inspecting materials based on scintillators coupled to one or more photodetectors by wavelength-shifted optical fibers, by temporal integration of photodetector signals. The energy of the transmitted radiation incident on the non-pixelated volume of the scintillation medium is converted into scintillation light extracted from the scintillation light extraction region by a plurality of optical waveguides. These geometrical features thus far provide an efficient and compact detector that enables geometrical features that are not obtainable for backscattering detection and energy fractionation of incident radiation. Additional energy decomposition transmission configurations are possible as distortion and misalignment compensation.
机译:本发明涉及一种用于检测材料的检测器和方法,该检测器和方法是基于通过光检测器信号的时间积分,通过波长移位的光纤耦合到一个或多个光检测器的闪烁体。入射到闪烁介质的未像素化体积上的透射辐射的能量通过多个光波导转换为从闪烁光提取区域提取的闪烁光。迄今为止,这些几何特征提供了一种高效且紧凑的检测器,其实现了对于入射辐射的反向散射检测和能量分级无法获得的几何特征。附加的能量分解传输配置也可以作为失真和失准补偿。

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