SSD ATE AUTOMATED TEST EQUIPMENT ATE SUPPORT FRAMEWORK FOR SOLID STATE DEVICE SSD ODD SECTOR SIZES AND PROTECTION MODES

摘要

An automatic inspection equipment (ATE) device includes a computer system including a system controller, the system controller being communicatively coupled to a tester processor and an FPGA. The tester processor is operable to generate commands and data to coordinate testing of a device under test (DUT) from the commands received from the system controller, the DUT supporting multiple non-standard sector sizes and multiple protection modes do. The FPGA is communicatively coupled to the tester processor, and the FPGA includes at least one hardware accelerator circuit operable to internally and transparently generate commands and data from the tester processor to test the DUT, wherein the at least one The hardware accelerator circuit of Calculates the protection information associated with the plurality of protection modes and can perform calculations to generate repeatable test patterns of sizes corresponding to each of the plurality of non-standard sector sizes.