首页> 外国专利> A method for detecting particles of a measurement gas in a measurement gas chamber, and a sensor device for detecting particles of a measurement gas in a measurement gas chamber

A method for detecting particles of a measurement gas in a measurement gas chamber, and a sensor device for detecting particles of a measurement gas in a measurement gas chamber

机译:用于在测量气体室中检测测量气体的颗粒的方法以及用于在测量气体室中检测测量气体的颗粒的传感器装置

摘要

The present invention relates to a method for detecting particles of a measurement gas in a measurement gas chamber using at least one sensor element 110. The sensor element 110 comprises at least one electrode structure 112, which electrode structure 112 comprises at least two electrode devices 114. The method comprises the following steps: a) actuating the sensor element 110 in at least one measurement mode, i. Applying at least one measurement voltage to the electrode structure 112, ii. The electrode structure 112 detects at least one measurement signal, in particular a measurement signal that quantifies the measurement current flowing between the electrode devices 114, the measurement signal being able to be affected by the particles. Operating the sensor element 110 in at least one measurement mode; And b) operating the sensor element 110 in at least one diagnostic mode, i. At least one diagnostic voltage is applied to the electrode structure 112, and the diagnostic voltage is less than the measured voltage, ii. The electrode structure 112 detects at least one diagnostic signal, in particular, a diagnostic signal that quantifies the diagnostic current flowing between the electrode devices 114, and iii. Sensor element (110) in the at least one diagnostic mode, comprising evaluating the diagnostic signal by comparing the diagnostic signal to at least two diagnostic thresholds and generating at least one information regarding a fault condition of the sensor element (110). To operate.
机译:本发明涉及一种使用至少一个传感器元件110检测测量气体腔室中的测量气体的颗粒的方法。传感器元件110包括至少一个电极结构112,该电极结构112包括至少两个电极装置114该方法包括以下步骤:a)以至少一种测量模式,即,以至少一种测量模式来致动传感器元件110。 ii。向电极结构112施加至少一个测量电压。电极结构112检测至少一个测量信号,尤其是对在电极装置114之间流动的测量电流进行量化的测量信号,该测量信号能够受到颗粒的影响。在至少一种测量模式下操作传感器元件110; b)在至少一种诊断模式下操作传感器元件110。至少一个诊断电压被施加到电极结构112,并且诊断电压小于所测量的电压,ii。电极结构112检测至少一个诊断信号,特别是量化在电极装置114和iii之间流动的诊断电流的诊断信号。处于至少一种诊断模式的传感器元件(110),包括通过将诊断信号与至少两个诊断阈值进行比较来评估诊断信号,并产生关于传感器元件(110)的故障状况的至少一种信息。操作。

著录项

  • 公开/公告号KR20200097279A

    专利类型

  • 公开/公告日2020-08-18

    原文格式PDF

  • 申请/专利权人 로베르트 보쉬 게엠베하;

    申请/专利号KR20207017693

  • 发明设计人 클렝크 마티아스;

    申请日2018-11-26

  • 分类号G01N15/06;F01N9;F02D41/14;F02D41/22;

  • 国家 KR

  • 入库时间 2022-08-21 11:06:11

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