TESTMODE SETTING CIRCUIT AND TESTMODE SETTING MEHOD FOR INCREASING THE NUMBER OF TESTMODE

摘要

Disclosed are a test mode setting circuit extending the number of test modes and a test mode setting method. In the test mode setting circuit of the present invention, each of a plurality of mode selection units generates each mode selection signal. Therefore, according to the test mode setting circuit and the test mode setting method of the present invention, a larger number of test modes can be specified and selected by using limited address signals.