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DETECTOR, SURFACE PROPERTY MEASURING DEVICE AND ROUNDNESS MEASURING DEVICE

机译:探测器,表面性能测量设备和圆度测量设备

摘要

A detector, a surface property measuring device and a roundness measuring device for automatically measuring a plurality of surfaces are provided in order to shorten the time required for the measurement. This problem is solved by a detector that has a contact holding probe that comes into contact with a surface of a measurement object, a holder that is configured to hold the probe, a measuring section that is configured to hold the holder hold that is in position to pivot about a rotary shaft and detect displacement of the holder, and includes a body configured to receive the measuring section, the holder holding the sensor so that a sensor axis as an axis of the Sensor and a body axis as the axis of the body are parallel, and the sensor axis and the body axis are offset in a first direction perpendicular to the body axis and the rotating shaft.
机译:为了缩短测量所需的时间,提供了用于自动测量多个表面的检测器,表面性质测量装置和圆度测量装置。通过具有与测量对象的表面接触的接触保持探针的检测器,被配置为保持探针的保持器,被配置为将保持器保持在适当位置的测量部分来解决该问题。绕旋转轴枢转并检测保持器的位移,并且包括构造成接收测量部分的主体,保持器保持传感器,使得传感器轴线作为传感器的轴线,而身体轴线作为主体的轴线传感器轴线和主体轴线平行,并且传感器轴线和主体轴线在垂直于主体轴线和旋转轴的第一方向上偏移。

著录项

  • 公开/公告号DE112018001621T5

    专利类型

  • 公开/公告日2020-01-16

    原文格式PDF

  • 申请/专利权人 TOKYO SEIMITSU CO. LTD.;

    申请/专利号DE112018001621T5

  • 发明设计人 HIDEKI MORII;

    申请日2018-03-22

  • 分类号G01B5/012;G01B5/016;G01B5/20;

  • 国家 DE

  • 入库时间 2022-08-21 11:01:33

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