A seam inspection device can automatically determine the quality of an image of a seam of a sewing product. The seam inspection device has an image data acquisition unit that acquires image data of a seam of a sewing product, a feature extraction unit that extracts a feature size of the seam from the image data of the seam of the sewing product that is acquired by the image data acquisition unit, and a quality determination unit that determines a quality of the seam based on the feature size of the seam.
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