首页> 外国专利> HOLOGRAPHIC IMAGING SYSTEM AND HOLOGRAPHIC IMAGING ANALYSIS METHOD WITH DETECTION OF FAULTS IN THE OBSERVATION CHAMBER

HOLOGRAPHIC IMAGING SYSTEM AND HOLOGRAPHIC IMAGING ANALYSIS METHOD WITH DETECTION OF FAULTS IN THE OBSERVATION CHAMBER

机译:探测室故障检测的全息成像系统及全息成像分析方法

摘要

The invention relates to a method for analyzing a medium by holographic imaging and to a corresponding imaging system, in which an image (101) of a sample of medium present in an observation chamber illuminated by a light source is acquired by a photosensitive sensor, the method being characterized in that it further comprises, after each acquisition, a defect detection phase using the gray levels of the acquired image, this defect detection phase comprising: a partition the acquired image (101) in a predetermined number N of thumbnails (32, 33); evaluating for each vignette and for the entire image a statistical parameter characterizing the distribution of the gray levels in the vignette and in the entire image, respectively; the calculation of an alarm factor from the statistical parameters previously evaluated; the comparison of the alarm factor obtained with a predetermined alarm threshold and the classification of the acquired image into a defective or valid image according to the result of the previous comparison.
机译:本发明涉及通过全息成像分析介质的方法以及相应的成像系统,其中通过光敏传感器获取存在于被光源照射的观察室中的介质样品的图像(101)。该方法的特征在于,该方法还包括:在每次获取之后,使用获取的图像的灰度级进行缺陷检测阶段,该缺陷检测阶段包括:将获取的图像(101)划分为预定数量N的缩略图(32, 33);为每个小插图和整个图像评估分别表征小插图和整个图像中灰度等级分布的统计参数;根据先前评估的统计参数计算警报因子;根据预先比较的结果,将获得的警报因子与预定的警报阈值进行比较,并将获取的图像分类为有缺陷或有效的图像。

著录项

  • 公开/公告号FR3076617B1

    专利类型

  • 公开/公告日2020-02-07

    原文格式PDF

  • 申请/专利权人 HORIBA ABX SAS;

    申请/专利号FR1850135

  • 发明设计人 ALI CHERIF ANAIS;JUNILLON LYONEL;

    申请日2018-01-08

  • 分类号G01N15/14;G01N33/49;G03H1/04;

  • 国家 FR

  • 入库时间 2022-08-21 11:00:40

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