ALBEDO MEASUREMENT OF A LAND SURFACE, WITHOUT THE NEED FOR A CONVENTIONAL ALBEDOMETER

摘要

The invention relates to the characterization of an albedo of a land, from a digital image acquired from this land using one or more cameras (CAM1, CAM2), in particular to optimize the arrangement of photovoltaic modules. bifacial on this ground. We provide: - a prior calibration of the camera, in which we acquire an intensity correction matrix for each pixel (x, y) of image acquired by the camera, and - a current characterization of the albedo of a terrain on which a target (REF), of known albedo αRéference, is deposited on the ground so as to be present in a current image acquired with the same camera, said current characterization of the albedo of the terrain being carried out by a processing of the current image in a processing circuit (CT), with a correction ImSiteCorr (x, y) of the current image by application of the correction matrix. The average light intensity Irefmoy of the pattern appearing in the corrected image is then estimated, to determine an albedo map of the terrain αSite (x, y) as a function of the known albedo of the pattern αReference, by a relation of the type: