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A specimen stripping apparatus with improved accuracy and a method of stripping a specimen using the apparatus
A specimen stripping apparatus with improved accuracy and a method of stripping a specimen using the apparatus
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机译:精度更高的标本剥离装置以及使用该装置剥离标本的方法
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摘要
The present invention relates to a specimen stripping apparatus with improved precision and a specimen stripping method using the apparatus, and more specifically, to inspect the structure of an insulator of a power cable, a tensile strength and elongation test, a heat shrinkage test, a crosslinking test, and a semiconducting specimen. For testing physical properties such as heating test, semiconducting layer and insulation layer foreign material test, the main body part 100, shanghai east part 200, loosening and fixing part so that the insulation of the power cable can be processed into a plate specimen of a certain uniform thickness. It consists of (300), the cutting part (400), and the control part (500), so that one side of the voltage cable insulator is cut in one operation, but after cutting, the insulator is prevented from colliding with the cutting part when the cutting part is restored to its original state. By avoiding it, the correct position of the insulator can be promoted, and subsequent cutting of the insulator is possible, so that a uniform plate-shaped specimen can be produced. According to this possible, it is a useful invention that allows the customer to secure the reliability.
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