首页> 外国专利> Apparatus for monitoring deposition rate, apparatus for organic layer deposition using the same, method for monitoring deposition rate, and method for manufacturing of organic light emitting display apparatus using the same

Apparatus for monitoring deposition rate, apparatus for organic layer deposition using the same, method for monitoring deposition rate, and method for manufacturing of organic light emitting display apparatus using the same

机译:用于监视沉积速率的设备,用于使用该设备监视有机层的设备,用于监视沉积速率的方法以及用于制造该设备的有机发光显示设备的方法

摘要

Embodiments of the present invention relates to a deposition rate monitoring device, an organic layer deposition device having the same, a deposition rate monitoring method, and a method of manufacturing an organic light emitting display device using the same, measuring a deposition rate of a deposition material emitted from a deposition source A deposition rate monitoring apparatus for a light source comprising: a light source emitting light having a wavelength within a photoexcitation bandwidth of a deposition material; A first optical system that irradiates light emitted from the light source toward a deposition material emitted from a deposition source; A second optical system that collects light emitted from the deposition material; And a first optical sensor that is emitted from the excited deposition material and detects the amount of light collected in the second optical system.
机译:本发明的实施方式涉及一种沉积速率监测装置,具有该沉积速率监测装置的有机层沉积装置,沉积速率监测方法以及使用该沉积速率监测装置制造有机发光显示装置的方法,该方法测量沉积的沉积速率。从沉积源发射的材料。一种用于光源的沉积速率监测设备,包括:光源,其发射的光的波长在沉积材料的光激发带宽内;第一光学系统,其将从光源发射的光朝向从沉积源发射的沉积材料照射;第二光学系统,其收集从沉积材料发射的光;第一光学传感器从激发的沉积材料发射并检测在第二光学系统中收集的光量。

著录项

  • 公开/公告号KR1021083610000B1

    专利类型

  • 公开/公告日2020-05-11

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR1020130072706

  • 申请日2013-06-24

  • 分类号

  • 国家 KR

  • 入库时间 2022-08-21 10:57:34

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