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Exam question analysis system, method, and program

摘要

PROBLEM TO BE SOLVED: To provide a technique for analyzing an examination question so that it can be used for study for passing. SOLUTION: A test question analysis system for analyzing a question of a pass/fail test includes a prerequisite knowledge discriminating unit for discriminating prerequisite knowledge required for solving a target question to be analyzed, and a sentence length of the target question. Pass the test based on a question sentence length calculation unit that calculates a certain question sentence length, an answer format identification unit that identifies the answer format for the target question, and the prerequisite knowledge, the question sentence length, and the answer format. In order to do so, an impact degree evaluation unit that evaluates a pass impact degree that is a degree required to correctly answer the target problem. [Selection diagram] Figure 1

著录项

  • 公开/公告号JP2020095686A

    专利类型发明专利

  • 公开/公告日2020.06.18

    原文格式PDF

  • 申请/专利权人 株式会社フォーサイト;

    申请/专利号JP2019172533

  • 发明设计人 山田 浩司;

    申请日2019.09.24

  • 分类号

  • 国家 JP

  • 入库时间 2022-08-21 10:56:22

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