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Mask-integrated surface protection tape and method for manufacturing semiconductor chip using mask-integrated surface protection tape

摘要

To provide a mask-integrated surface protection tape which eliminates mask formation by a photolithography process in manufacturing a semiconductor chip using a plasma dicing method, which exhibits excellent performance in each process of semiconductor chip manufacturing, and which is also excellent in operability and workability, and a method of manufacturing a semiconductor chip using the tape.SOLUTION: There is provided a mask-integrated surface protection tape including at least a base material film, an adhesive layer provided on the base material layer, and a mask material layer provided on the adhesive layer. The mask material layer is radiation curable. The mask material layer has a rupture elongation after radiation curing of 50-250%, and has a storage modulus after radiation curing of 100,000 Pa or more. There is also provided a method of manufacturing a semiconductor chip using the tape.SELECTED DRAWING: Figure 4

著录项

  • 公开/公告号JP6719489B2

    专利类型

  • 公开/公告日2020.07.08

    原文格式PDF

  • 申请/专利权人 古河電気工業株式会社;

    申请/专利号JP2018015734

  • 发明设计人 阿久津 晃;

    申请日2018.01.31

  • 分类号

  • 国家 JP

  • 入库时间 2022-08-21 10:55:46

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