首页> 外国专利> Free residual chlorine concentration calculation method, free residual chlorine concentration calculation system, and space cleaning system

Free residual chlorine concentration calculation method, free residual chlorine concentration calculation system, and space cleaning system

摘要

PROBLEM TO BE SOLVED: To calculate the free residual chlorine concentration for detecting the optimum free residual chlorine concentration in order to suppress the growth of bacteria by detecting the free residual chlorine concentration in an aqueous solution by a simple method capable of automatically adjusting the concentration. Provided are a method, a free residual chlorine concentration calculation system, and a space cleaning system with a fungus growth suppression function. SOLUTION: A chlorine component adding means (sodium hypochlorite adding means 2) for adding a chlorine component (sodium hypochlorite) to an aqueous solution R, and an aqueous solution R before and after addition of a chlorine component (sodium hypochlorite) The electric conductivity measuring means 3 for measuring the electric conductivity of No. 1 is provided, and the free residual chlorine concentration of the aqueous solution R is calculated and confirmed from the increment of the electric conductivity measured by the electric conductivity measuring means 3. [Selection diagram] Fig. 3

著录项

  • 公开/公告号JP2020094986A

    专利类型发明专利

  • 公开/公告日2020.06.18

    原文格式PDF

  • 申请/专利权人 クリナップ株式会社;

    申请/专利号JP2018234721

  • 发明设计人 小井戸 文彦;

    申请日2018.12.14

  • 分类号

  • 国家 JP

  • 入库时间 2022-08-21 10:55:44

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号