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PROCEDES ET SYSTEMES POUR DETERMINER LE NOMBRE ATOMIQUE MOYEN ET LA MASSE DE MATIERES

摘要

Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

著录项

  • 公开/公告号EP1766380B1

    专利类型

  • 公开/公告日2020.06.10

    原文格式PDF

  • 申请/专利权人 Passport Systems, Inc.;

    申请/专利号EP05770042.9

  • 发明设计人

    申请日2005.07.08

  • 分类号

  • 国家 EP

  • 入库时间 2022-08-21 10:53:52

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