首页> 外国专利> SYSTÈME, CHAMBRE DE TEST, ET PROCÉDÉ DE MESURE DU TEMPS DE RÉPONSE D'UN CAPTEUR DE PRESSION

SYSTÈME, CHAMBRE DE TEST, ET PROCÉDÉ DE MESURE DU TEMPS DE RÉPONSE D'UN CAPTEUR DE PRESSION

摘要

A test chamber is used within a system for testing microelectromechanical systems (MEMS) pressure sensors. The system includes a processor, two air tanks pressurized to different air pressures, a high speed switch mechanism, and the test chamber. The test chamber houses a MEMS pressure sensor to be tested, a control pressure sensor, and a temperature sensor. The MEMS pressure sensor and the control pressure sensor are located in a cavity within the test chamber. The cavity is of minimal size and has a domed inner surface. A response time of the MEMS pressure sensor within the cavity can be characterized by utilizing the system and subjecting the MEMS pressure sensor to a pressure stimulus pulse produced by switching between the two air tanks.

著录项

  • 公开/公告号EP3287759B1

    专利类型

  • 公开/公告日2020.05.13

    原文格式PDF

  • 申请/专利权人 NXP USA, Inc.;

    申请/专利号EP17172328.1

  • 发明设计人

    申请日2017.05.22

  • 分类号

  • 国家 EP

  • 入库时间 2022-08-21 10:53:01

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