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Mapping spot blotch common root rot (causal agent: bipolaris sorokiniana) resistance genes in barley

机译:绘制大麦斑点斑点和常见根腐病(病原体:bipolaris sorokiniana)抗性基因

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摘要

The fungal pathogen Bipolaris sorokiniana (teleomorph Cochliobolus sativus)causes the foliar disease spot blotch (SB) and the root disease common root rot (CRR). Spot blotch and CRR are serious disease constraints to barley production in warmer growing regions of the world, with estimated yield losses ranging from 30-70% from SB and 15-30% for CRR. Although chemical treatments may assist inudcontrolling spot blotch infections, the most effective and environmentally sound means of control for each disease is breeding for varieties with natural resistance. InudAustralia, no commercially available varieties offer resistance to either SB or CRR. This study has sought to establish molecular markers that will be useful for selecting for resistance to each of these important fungal diseases.ududBarley cultivars derived from the breeding line NDB112 have provided durable SB resistance in the North Dakota region of the USA for over 40 years. The robustnessudof this resistance had not been determined under Australian environmental conditions or with those B. sorokiniana pathotypes present within Australia. Toudelucidate the genetics of resistance, two seedling and two field trials were conducted on an ND11231-12/VB9524 (ND/VB) doubled haploid (DH) population (180 lines).udA molecular map of the ND/VB population was curated in order to provide a firm basis for mapping of resistance loci. Composite interval mapping revealed thatuddifferent gene combinations are effective at different stages of plant development. Seedling resistance was found to be conditioned by a major locus on the short arm ofudchromosome 7H and this region was validated in the related population ND11231-11/WI2875*17. A minor quantitative locus on chromosome 5HS was detected in one of the two seedling trials. However, this region requires further investigation to confirm its association to SB resistance in this population. Field resistance to SB in adult plants was found to be associated with two major quantitative trait loci (QTL)on chromosomes 7HS and 3HS; and a putative third minor QTL on chromosome 2HS. The 7H region is common between seedling and field resistance and is the most important locus for the expression of resistance at both stages of plant development. These findings largely concur with genetic studies of this trait in tworowed barley germplasm in North American environments.ududCommon root rot is a difficult disease to phenotype for, and breeding programs will benefit from the identification of molecular markers linked to resistance. Data wasudprovided from field trials of subsets of the population over four years. Using a novel approach combining the efficiency of bulked-segregant analysis with highthroughputudDiversity Arrays Technology markers (BSA-DArT), CRR resistance was found to be conditioned by three putative QTL in an unmapped Delta/Lindwall population. QTL were identified on chromosomes 2HS, 4HS, and 7HS. To validateudthe trait-linkage associations between the DArT markers and the CRR QTL,microsatellite (SSR) markers known to map to the regions identified by BSA-DArT were used. The 2H and 4H regions were validated using marker regression of the SSR markers in most seedling trials, whereas the 7H QTL, which is proximal to the location of the SB resistance QTL in the ND/VB population, was detected in only one seedling trial.ududThe QTL identified in this study offer potential to combat the foliar and root diseases causes by this fungal pathogen. The chromosomal location of QTL for SB and CRR resistance have been found to differ in the ND/VB and D/L populations,which suggests that resistance to each disease is independently inherited. Further research is required to confirm the hypothesis that it is possible to combineudresistance to both diseases into a single genotype. Such allelic combinations would provide elite germplasm that would benefit barley breeding programs world-wide.
机译:真菌病原体Bipolaris sorokiniana(teleomorph Cochliobolus sativus)引起叶病斑斑(SB)和根病常见根腐病(CRR)。点斑病和CRR在世界上较热的生长地区对大麦生产造成严重的疾病限制,估计单产的损失为SB的30-70%,CRR为15-30%。尽管化学处理可能有助于控制斑斑感染,但对每种疾病最有效且对环境无害的控制手段是育种具有自然抗性的品种。在澳大利亚,没有任何商用品种对SB或CRR具有抗性。这项研究试图建立分子标记,这些分子标记将有助于选择对每种重要真菌疾病的抗性。 ud ud源自育种系NDB112的大麦品种在美国北达科他州地区提供了超过SB的持久SB抗性40年在澳大利亚的环境条件下或澳大利亚境内存在的那些B. sorokiniana致病型尚未确定这种抗药性的强弱。为了阐明抗药性的遗传,对ND11231-12 / VB9524(ND / VB)双倍单倍体(DH)群体(180系)进行了两次幼苗和两次田间试验。 udA ND / VB种群的分子图谱是进行整理,以便为抗性基因座的定位提供坚实的基础。复合区间作图显示不同的基因组合在植物发育的不同阶段均有效。发现幼苗抗性受染色体7H短臂上的主要基因座调节,并且该区域在相关种群ND11231-11 / WI2875 * 17中得到验证。在两个幼苗试验之一中,检测到染色体5HS上的一个次要定量基因座。但是,该地区需要进一步调查,以确认其与该人群中SB抗性的相关性。已发现成年植物对SB的田间抗性与7HS和3HS染色体上的两个主要定量性状基因座(QTL)有关。以及第2HS号染色体上的第三个次要QTL。 7H区在幼苗和田间抗性之间是共同的,并且是在植物发育的两个阶段表达抗性的最重要位点。这些发现在很大程度上与北美环境下的大麦种质两性状的遗传学研究相符。共同的根腐病是一种难以表型的疾病,育种程序将受益于与抗性相关的分子标记的鉴定。数据来自四年来人口子集的现场试验。使用一种新颖的方法,将体积隔离分析的效率与高通量 udDiversity Arrays Technology标记(BSA-DArT)相结合,发现CRR抗性受到未映射Delta / Lindwall种群中三个推定的QTL的调节。在2HS,4HS和7HS染色体上鉴定了QTL。为了验证DArT标记和CRR QTL之间的性状关联,使用了已知映射到BSA-DArT识别区域的微卫星(SSR)标记。在大多数苗木试验中,使用SSR标记的标志回归验证了2H和4H区域,而仅在一项苗木试验中检测到了与ND / VB群体中SB抗性QTL位置接近的7H QTL。 ud ud在这项研究中鉴定出的QTL具有对抗这种真菌病原体引起的叶面和根部疾病的潜力。已发现ND / VB和D / L人群中QSB对SB和CRR抗性的染色体位置不同,这表明对每种疾病的抗性是独立遗传的。需要进一步的研究来证实这一假说,即有可能将对两种疾病的抗性组合为单一基因型。这样的等位基因组合将提供优良的种质,这将有益于世界范围的大麦育种计划。

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    Bovill Jessica;

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  • 年度 2008
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