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Arbitrarily oriented crack near interface in piezoelectric bimaterials

机译:压电双材料界面附近的任意取向裂纹

摘要

Arbitrarily oriented crack near interface in piezoelectric bimaterials is considered. After deriving the fundamental solution for an edge dislocation near the interface, the present problem can be expressed as a system of singular integral equations by modeling the crack as continuously distributed edge dislocations. In the paper, the dislocations are described by a density function defined on the crack line. By solving the singular integral equations numerically, the dislocation density function is determined. Then, the stress intensity factors (SIFs) and the electric displacement intensity factor (EDIF) at the crack tips are evaluated. Subsequently, the influences of the interface on crack tip SIFs, EDIF, and the mechanical strain energy release rate (MSERR) are investigated. The J-integral analysis in piezoelectric bimaterals is also performed. It is found that the path-independent of J1-integral and the path-dependent of J2-integral found in no-piezoelectric bimaterials are still valid in piezoelectric bimaterials.
机译:考虑了压电双材料界面附近的任意取向裂纹。在得出界面附近边缘错位的基本解后,通过将裂纹建模为连续分布的边缘错位,可以将当前问题表示为奇异积分方程组。在本文中,位错由裂纹线上定义的密度函数描述。通过数值求解奇异积分方程,确定位错密度函数。然后,评估裂纹尖端处的应力强度因子(SIF)和电位移强度因子(EDIF)。随后,研究了界面对裂纹尖端SIF,EDIF和机械应变能释放速率(MSERR)的影响。还进行了压电双材料的J积分分析。发现在无压电双材料中发现的J1积分的路径无关和J2积分的路径相关在压电双材料中仍然有效。

著录项

  • 作者

    Tian W; Chau KT;

  • 作者单位
  • 年度 2003
  • 总页数
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类

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