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One-step wet chemical deposition of NiO from the electrochemical reduction of nitrates in ionic liquid based electrolytes

机译:离子液体基电解质中硝酸盐的电化学还原,一步一步湿法化学沉积NiO

摘要

Aprotic PYR14TFSI (1-butyl-1-methylpyrrolidinium bis(trifluoromethanesulfonyl)) ionic liquid served to develop a new electrochemical route for one-step deposition of NiO from PYR14NO3 reduction (1-butyl-1-methylpyrrolidinium nitrate) in a Ni(TFSI)2 (Nickel (II) bis(trifluoromethanesulfonyl)imide) containing electrolyte. The high solubility of the novel PYR14NO3 salt in PYR14TFSI (>0.1 M) in comparison with other oxygenated precursors such as oxygen gas, NaNO 3 or KNO3 (i.e. 10-15 mM) allows the formulation of a broad variety of electrolytes which opens wide possibilities to tune the physico-chemical properties of NiO films (e.g. morphology: from flat to nanostructured films). Furthermore, electrochemical deposition in an electrolyte containing low water concentration (>30 ppm by Karl Fisher titration) served to demonstrate that only a small amount of moisture dramatically affects the electrochemical reduction of NO3 -, resulting in OH - generation close to the cathode and subsequent NiO(OH)/Ni(OH) 2 deposition, as proved by X-ray diffraction and X-ray photoelectron spectroscopy. This finding highlights the importance of aprotic ionic liquids in developing a general electrochemical route for metal oxide deposition without the formation of metal hydroxide species, thus avoiding the requirement for post-deposition annealing treatments. The versatility of the present deposition route as well as its impact in (opto)electronic devices was pointed out by the successful preparation of nanostructured n-p ZnO/NiO heterojunctions exhibiting rectifying current-voltage characteristics. © 2013 Elsevier Ltd.
机译:非质子化的PYR14TFSI(1-丁基-1-甲基吡咯烷鎓双(三氟甲磺酰基))离子液体为从PYR14NO3还原(硝酸1-丁基-1-甲基吡咯烷鎓)在Ni(TFSI)中一步沉积NiO开发了一种新的电化学途径2(含镍(Ⅱ)双(三氟甲磺酰基)酰亚胺)的电解质。与其他氧化前体(例如氧气,NaNO 3或KNO3)(即10-15 mM)相比,新型PYR14NO3盐在PYR14TFSI中具有高溶解度(> 0.1 M),从而可以配制多种电解质,从而开辟了广阔的可能性调整NiO薄膜的物理化学性质(例如,形态:从平坦的薄膜到纳米结构的薄膜)。此外,在低水浓度(卡尔·费舍尔滴定法> 30 ppm)的电解质中进行电化学沉积可证明仅少量水分会显着影响NO3-的电化学还原,从而导致OH-在阴极附近生成,随后发生通过X射线衍射和X射线光电子能谱证明了NiO(OH)/ Ni(OH)2的沉积。该发现强调了非质子离子液体在开发用于金属氧化物沉积而不形成金属氢氧化物物质的通用电化学路线中的重要性,从而避免了对沉积后退火处理的需求。通过成功制备具有整流电流-电压特性的纳米结构n-p ZnO / NiO异质结,指出了当前沉积路径的多功能性及其对(光电)电子器件的影响。 ©2013爱思唯尔有限公司。

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