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IGBT Dynamic Loss Reduction through Device Level Soft Switching

机译:通过设备级软切换降低IGBT动态损失

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摘要

Due to its low conduction loss, hence high current ratings, as well as low cost, Silicon Insulated Gate Bipolar Transistor (Si IGBT) is widely used in high power applications. However, its switching frequency is generally low because of relatively large switching losses. Silicon carbide Metal-Oxide-Semiconductor Field-Effect Transistor (SiC MOSFET) is much more superior due to their fast switching speed, which is determined by the internal parasitic capacitance instead of the stored charges, like the IGBT. By the combination of SiC MOSFET and Si IGBT, this paper presents a novel series hybrid switching method to achieve IGBT’s dynamic switching loss reduction by switching under Zero Voltage Hard Current (ZVHC) turn-on and Zero Current Hard Voltage (ZCHV) turn-off conditions. Both simulation and experimental results of IGBT are carried out, which shows that the soft switching of IGBT has been achieved both in turn-on and turn-off period. Thus 90% turn-on loss and 57% turn-off loss are reduced. Two different IGBTs’ test results are also provided to study the modulation parameter’s effect on the turn-off switching loss. Furthermore, with the consideration of voltage and current transient states, a new soft switching classification is proposed. At last, another improved modulation and Highly Efficient and Reliable Inverter Concept (HERIC) inverter are given to validate the effectiveness of the device level hybrid soft switching method application.
机译:由于其低导通损耗,因此高电流额定值,以及低成本,硅绝缘栅双极晶体管(Si IGBT)广泛用于高功率应用中。然而,由于相对较大的开关损耗,其开关频率通常很低。碳化硅金属氧化物 - 半导体场效应晶体管(SiC MOSFET)由于其快速开关速度而言,由内部寄生电容而不是存储的电荷确定,如IGBT。通过SiC MOSFET和SI IGBT的组合,本文提出了一种新颖的混合式开关方法,通过在零电压硬电流(ZVHC)开启和零电流硬电压(ZCHV)关闭下实现IGBT的动态开关损耗。状况。进行IGBT的模拟和实验结果,表明IGBT的软切换在开启和关闭期间已经实现。因此,降低了90%的开启损耗和57%的关闭损耗。还提供了两种不同的IGBTS测试结果,以研究调制参数对关闭开关损耗的影响。此外,随着电压和电流瞬态状态的考虑,提出了一种新的软切换分类。最后,给出了另一种改进的调制和高效可靠的逆变器概念(赫里奇)逆变器验证了设备电平混合软切换方法应用的有效性。

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