Optical Radiation Measurement with Selected Detectors and Matched ElectronicCircuits Between 200 nm and 20 um

摘要

The purpose of this Technical Note is to summarize the results of the researchand development work carried out at the Optical Sensor Group of the Optical Technology Division for constructing accurate and wide dynamic range radiometers with high performance detectors for the 200 nm to 20 micrometer wavelength range. Linear and stable operation was required from these radiometers to achieve detector spectral responsitivity transfer with low uncertainty. Large area thermal, pyroelectric, photoconductive (PC), and photovoltaic (PV) detectors were selected, applied, and characterized at different controlled temperatures between 4.2 K and 300 K. The resistance of these detectors range from 15 chm to 50 chm, their capacitance ranged from 0.18 nF to 36 nF. The detector output-signal measuring electronic circuits had to be designed and individually matched to the complex impedance of the selected detector to optimize radiometer performance.