Proceedings of the Veterans Administration Diagnostic Electron Microscopy Conference (3rd), May 10-11, 1977, Chicago, Illinois

摘要

The conference provided an opportunity for the exchange of information and ideas on administrative and scientific aspects of the Veterans Administration (VA) program for diagnostic use of electron microscopy (EM). The need for full utilization of the program and maintenance of adequate and up-to-date records in the VA diagnostic EM units. The papers presented at the conference covered topics on recent research and developments in the use of electron microscopy.