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Internal Noise of Low-Frequency Preamplifiers

机译:低频前置放大器的内部噪声

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Experimental measurements of low frequency preamplifiers show that a type LM394 bipolar input stage has less internal input noise than the popular PAR-113 commercial amplifier for source resistances under 1000 ohms. A type 2N6483 JFET design shows similar input noise to the PAR-113. The input current noise of the JFET design is insignificant compared with the Nyquist noise of the source resistance. (Author)

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