Multiwavelength pyrometry to correct for reflected radiation

摘要

Computer curve fitting is used in multiwavelength pyrometry to measure the temperature of a surface in the presence of reflected radiation by decomposing its radiation spectrum. Computer-simulated spectra (at a surface temperature of 1000 K; in the wavelength region 0.3 to 20 microns; with a reflected radiation-source temperature of 700 to 2500 K; and reflector emissivity from 0.1 to 0.9) were generated and decomposed. This method of pyrometry determined the surface temperatures under these conditions to within 5 percent. The practicability of the method was further demonstrated by the successful analysis of a related problem--decomposition of the real spectrum of an infrared source containing two emitters to determine their temperatures.