Optical Properties of Semiconductor-Metal Composite Thin Films in the Infrared Region

摘要

Germanium:Silver (Ge:Ag) composite thin films having different concentrations of Ag, ranging from 7 to 40 have been prepared by dc co-sputtering of Ge an Ag and the films' surface morphology and optical properties have been characterized using transmission electron microscopy (TEM) and infrared spectrophotometry. It is seen that while the films containing lower concentrations of Ag have island-like morphology (i.e. Ag particles distributed in a Ge matrix), the higher metallic concentration films tend to have symmetric distribution of Ag and Ge.